A Novel Approach to Fabricate a Polyamide-Copper TENG in Vertical Contact-Separation Mode

Authors

  • Hitesh Kumar Sharma *

    Materials Research Centre, Malaviya National Institute of Technology, Jaipur, Rajasthan 302017, India
  • Atul Kumar Sharma

    Materials Research Centre, Malaviya National Institute of Technology, Jaipur, Rajasthan 302017, India
  • Vijay Janyani

    Department of Electronics Engineering, Malaviya National Institute of Technology, Jaipur, Rajasthan 302017, India
  • Dharmendra Boolchandani

    Department of Electronics Engineering, Malaviya National Institute of Technology, Jaipur, Rajasthan 302017, India

DOI:

https://doi.org/10.55121/nefm.v4i1.411

Keywords:

Triboelectric Energy Harvesters , FESEM , AFM, Four Probe IV-Testing

Abstract

In this study, a novel design concept for a contact-separation Triboelectric Nanogenerator (TENG) utilizing polyimide (PI) film and copper (Cu) tape is presented. The innovation lies in enhancing the surface area and roughness of the PI film using 1000-grit sandpaper, which is manually rubbed over the film. This surface treatment significantly improves charge transfer between the PI and Cu layers, thereby enhancing the electrical performance of the TENG. The modified (rubbed) PI-Cu TENG achieved an open-circuit voltage (Voc) of 25 V and a short-circuit current (Isc) of 0.7 µA. Compared to a pristine (untreated) PI film, the hand-rubbed PI-Cu TENG demonstrated an increase in performance. Voc and Isc were improved by 78.6% and 75%, respectively, due to the increased surface roughness and area, which facilitated more efficient charge transfer at the interface. Additionally, the instantaneous power density showed a notable increase of 68.18% relative to the pristine film. The prototype device was characterized using a two-probe I-V measurement system to obtain Isc and Voc responses. Morphological changes in the rubbed PI film were confirmed via Scanning Electron Microscopy (SEM), performed using an FEI Nova Nano FESEM 450, revealing the presence of scratch-induced torsional layers. Surface roughness and topographical features were further analyzed using Bruker Multimode-8 Atomic Force Microscopy (AFM).

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How to Cite

Sharma, H. K., Sharma, A. K., Janyani, V., & Boolchandani, D. (2025). A Novel Approach to Fabricate a Polyamide-Copper TENG in Vertical Contact-Separation Mode. New Environmentally-Friendly Materials, 4(1), 57–66. https://doi.org/10.55121/nefm.v4i1.411

Issue

Vol. 4 No. 1 (May 2025): In Progress

Section

Communication

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Copyright (c) 2025 Hitesh Kumar Sharma, Atul Kumar Sharma, Vijay Janyani, Dharmendra Boolchandani

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This work is licensed under a Creative Commons Attribution 4.0 International License.